]> git.karo-electronics.de Git - karo-tx-linux.git/commit
mmc: mmc_test: test to measure how sg_len affect performance
authorPer Forlin <per.forlin@linaro.org>
Fri, 1 Jul 2011 16:55:27 +0000 (18:55 +0200)
committerOliver Wendt <ow@karo-electronics.de>
Mon, 30 Sep 2013 12:11:06 +0000 (14:11 +0200)
commitb6537ac7829ca67734d83a8b926b8a0dfc520654
treecba1012c8b767c7c6a6af037c91825e4116eca30
parented0abded73908ef075c81eda336e81768be9a286
mmc: mmc_test: test to measure how sg_len affect performance

Add a test that measures how the mmc bandwidth depends on the numbers of
sg elements in the sg list. The transfer size if fixed and sg length goes
from a few up to 512. The purpose is to measure overhead caused by
multiple sg elements.

Signed-off-by: Per Forlin <per.forlin@linaro.org>
Acked-by: Kyungmin Park <kyungmin.park@samsung.com>
Acked-by: Arnd Bergmann <arnd@arndb.de>
Reviewed-by: Venkatraman S <svenkatr@ti.com>
Tested-by: Sourav Poddar <sourav.poddar@ti.com>
Tested-by: Linus Walleij <linus.walleij@linaro.org>
Signed-off-by: Chris Ball <cjb@laptop.org>
drivers/mmc/card/mmc_test.c