ENGR00231965 MX6 USB CV 3.0 test fail

ENGR00231965 MX6 USB CV 3.0 test fail

- For USB CV 3.0 test, the gap between the ACK of set_address and
  the subsequent setup packet may be very little, say 500us, and
  if the latency we handle the ep completion is greater than this
  gap, there is no response to the subsequent packet. It will
  cause CV test fail

- There is another way to set the address, it should set the bit 24
  to 1 with the right address, and then IC controller will set the
  address when the IN req complete instead of SW do it. It is more
  fast so it can fix the CV 3.0 test fail issue

Signed-off-by: Tony LIU <junjie.liu@freescale.com>