From: Joe Perches Date: Wed, 14 Nov 2007 04:53:51 +0000 (-0800) Subject: [E1000E]: convert register test macros to functions X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=2a88719197bde746006c18ebe8f3576c87991419;p=linux-beck.git [E1000E]: convert register test macros to functions Add functions for reg_pattern_test and reg_set_and check Changed macros to use these functions Compiled x86, untested Size decreased ~2K old: $ size drivers/net/e1000e/ethtool.o text data bss dec hex filename 14461 0 0 14461 387d drivers/net/e1000e/ethtool.o new: $ size drivers/net/e1000e/ethtool.o text data bss dec hex filename 12498 0 0 12498 30d2 drivers/net/e1000e/ethtool.o Signed-off-by: Joe Perches Signed-off-by: Auke Kok Signed-off-by: David S. Miller --- diff --git a/drivers/net/e1000e/ethtool.c b/drivers/net/e1000e/ethtool.c index e6ff3af8ef0f..6d9c27fd0b53 100644 --- a/drivers/net/e1000e/ethtool.c +++ b/drivers/net/e1000e/ethtool.c @@ -690,41 +690,63 @@ err_setup: return err; } -#define REG_PATTERN_TEST(R, M, W) REG_PATTERN_TEST_ARRAY(R, 0, M, W) -#define REG_PATTERN_TEST_ARRAY(reg, offset, mask, writeable) \ -{ \ - u32 _pat; \ - u32 _value; \ - u32 _test[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; \ - for (_pat = 0; _pat < ARRAY_SIZE(_test); _pat++) { \ - E1000_WRITE_REG_ARRAY(hw, reg, offset, \ - (_test[_pat] & writeable)); \ - _value = E1000_READ_REG_ARRAY(hw, reg, offset); \ - if (_value != (_test[_pat] & writeable & mask)) { \ - ndev_err(netdev, "pattern test reg %04X " \ - "failed: got 0x%08X expected 0x%08X\n", \ - reg + offset, \ - value, (_test[_pat] & writeable & mask)); \ - *data = reg; \ - return 1; \ - } \ - } \ +bool reg_pattern_test_array(struct e1000_adapter *adapter, u64 *data, + int reg, int offset, u32 mask, u32 write) +{ + int i; + u32 read; + static const u32 test[] = + {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; + for (i = 0; i < ARRAY_SIZE(test); i++) { + E1000_WRITE_REG_ARRAY(&adapter->hw, reg, offset, + (test[i] & write)); + read = E1000_READ_REG_ARRAY(&adapter->hw, reg, offset); + if (read != (test[i] & write & mask)) { + ndev_err(adapter->netdev, "pattern test reg %04X " + "failed: got 0x%08X expected 0x%08X\n", + reg + offset, + read, (test[i] & write & mask)); + *data = reg; + return true; + } + } + return false; } -#define REG_SET_AND_CHECK(R, M, W) \ -{ \ - u32 _value; \ - __ew32(hw, R, W & M); \ - _value = __er32(hw, R); \ - if ((W & M) != (_value & M)) { \ - ndev_err(netdev, "set/check reg %04X test failed: " \ - "got 0x%08X expected 0x%08X\n", R, (_value & M), \ - (W & M)); \ - *data = R; \ - return 1; \ - } \ +static bool reg_set_and_check(struct e1000_adapter *adapter, u64 *data, + int reg, u32 mask, u32 write) +{ + u32 read; + __ew32(&adapter->hw, reg, write & mask); + read = __er32(&adapter->hw, reg); + if ((write & mask) != (read & mask)) { + ndev_err(adapter->netdev, "set/check reg %04X test failed: " + "got 0x%08X expected 0x%08X\n", reg, (read & mask), + (write & mask)); + *data = reg; + return true; + } + return false; } +#define REG_PATTERN_TEST(R, M, W) \ + do { \ + if (reg_pattern_test_array(adapter, data, R, 0, M, W)) \ + return 1; \ + } while (0) + +#define REG_PATTERN_TEST_ARRAY(R, offset, M, W) \ + do { \ + if (reg_pattern_test_array(adapter, data, R, offset, M, W)) \ + return 1; \ + } while (0) + +#define REG_SET_AND_CHECK(R, M, W) \ + do { \ + if (reg_set_and_check(adapter, data, R, M, W)) \ + return 1; \ + } while (0) + static int e1000_reg_test(struct e1000_adapter *adapter, u64 *data) { struct e1000_hw *hw = &adapter->hw;