From: Johan Hovold Date: Thu, 21 Mar 2013 11:36:28 +0000 (+0100) Subject: USB: ark3116: remove bogus disconnect test in close X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=5c3275282422dcb895e2e9902c7fba4fd9d2512b;p=linux-beck.git USB: ark3116: remove bogus disconnect test in close Remove bogus (and unnecessary) test for serial->dev being NULL in close. The device is never cleared, and close is never called after a completed disconnect anyway. Signed-off-by: Johan Hovold Signed-off-by: Greg Kroah-Hartman --- diff --git a/drivers/usb/serial/ark3116.c b/drivers/usb/serial/ark3116.c index 4775f8209e55..3b811feb35fd 100644 --- a/drivers/usb/serial/ark3116.c +++ b/drivers/usb/serial/ark3116.c @@ -341,18 +341,15 @@ static void ark3116_close(struct usb_serial_port *port) { struct usb_serial *serial = port->serial; - if (serial->dev) { - /* disable DMA */ - ark3116_write_reg(serial, UART_FCR, 0); - - /* deactivate interrupts */ - ark3116_write_reg(serial, UART_IER, 0); + /* disable DMA */ + ark3116_write_reg(serial, UART_FCR, 0); - usb_serial_generic_close(port); - if (serial->num_interrupt_in) - usb_kill_urb(port->interrupt_in_urb); - } + /* deactivate interrupts */ + ark3116_write_reg(serial, UART_IER, 0); + usb_serial_generic_close(port); + if (serial->num_interrupt_in) + usb_kill_urb(port->interrupt_in_urb); } static int ark3116_open(struct tty_struct *tty, struct usb_serial_port *port)