From: Carolyn Wyborny <carolyn.wyborny@intel.com>
Date: Thu, 24 Feb 2011 03:12:15 +0000 (+0000)
Subject: igb: Fix reg pattern test in ethtool for i350 devices
X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=93ed835928f3100c95e0408df0543f35d03f7c23;p=linux-beck.git

igb: Fix reg pattern test in ethtool for i350 devices

This fixes the reg_pattern_test so that the test does not fail
on i350 parts.

Signed-off-by: Carolyn Wyborny <carolyn.wyborny@intel.com>
Tested-by: Jeff Pieper <jeffrey.e.pieper@intel.com>
Signed-off-by: Jeff Kirsher <jeffrey.t.kirsher@intel.com>
---

diff --git a/drivers/net/igb/igb_ethtool.c b/drivers/net/igb/igb_ethtool.c
index a70e16bcfa7e..16bbd4922bc3 100644
--- a/drivers/net/igb/igb_ethtool.c
+++ b/drivers/net/igb/igb_ethtool.c
@@ -1070,7 +1070,7 @@ static bool reg_pattern_test(struct igb_adapter *adapter, u64 *data,
 		{0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
 	for (pat = 0; pat < ARRAY_SIZE(_test); pat++) {
 		wr32(reg, (_test[pat] & write));
-		val = rd32(reg);
+		val = rd32(reg) & mask;
 		if (val != (_test[pat] & write & mask)) {
 			dev_err(&adapter->pdev->dev, "pattern test reg %04X "
 				"failed: got 0x%08X expected 0x%08X\n",