From: Xi Wang Date: Wed, 8 Jul 2015 21:00:56 +0000 (-0700) Subject: test_bpf: extend tests for 32-bit endianness conversion X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=ba29becd770ffec90f3af896daffac6b9acec608;p=linux-beck.git test_bpf: extend tests for 32-bit endianness conversion Currently "ALU_END_FROM_BE 32" and "ALU_END_FROM_LE 32" do not test if the upper bits of the result are zeros (the arm64 JIT had such bugs). Extend the two tests to catch this. Acked-by: Daniel Borkmann Acked-by: Alexei Starovoitov Signed-off-by: Xi Wang Signed-off-by: David S. Miller --- diff --git a/lib/test_bpf.c b/lib/test_bpf.c index 7f58c735d745..9198f28a5528 100644 --- a/lib/test_bpf.c +++ b/lib/test_bpf.c @@ -3674,6 +3674,9 @@ static struct bpf_test tests[] = { .u.insns_int = { BPF_LD_IMM64(R0, 0x0123456789abcdefLL), BPF_ENDIAN(BPF_FROM_BE, R0, 32), + BPF_ALU64_REG(BPF_MOV, R1, R0), + BPF_ALU64_IMM(BPF_RSH, R1, 32), + BPF_ALU32_REG(BPF_ADD, R0, R1), /* R1 = 0 */ BPF_EXIT_INSN(), }, INTERNAL, @@ -3708,6 +3711,9 @@ static struct bpf_test tests[] = { .u.insns_int = { BPF_LD_IMM64(R0, 0x0123456789abcdefLL), BPF_ENDIAN(BPF_FROM_LE, R0, 32), + BPF_ALU64_REG(BPF_MOV, R1, R0), + BPF_ALU64_IMM(BPF_RSH, R1, 32), + BPF_ALU32_REG(BPF_ADD, R0, R1), /* R1 = 0 */ BPF_EXIT_INSN(), }, INTERNAL,