From: Brian Norris Date: Wed, 2 Nov 2011 20:34:44 +0000 (-0700) Subject: mtd: nand: scan 1st and 2nd page for Macronix SLC X-Git-Tag: next-20111109~29^2 X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=c0af4d0929e0a01a23f76fa4b318a94ec027835a;p=karo-tx-linux.git mtd: nand: scan 1st and 2nd page for Macronix SLC Signed-off-by: Brian Norris Signed-off-by: Artem Bityutskiy --- diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c index 3ed9c5e4d34e..35b4565050f1 100644 --- a/drivers/mtd/nand/nand_base.c +++ b/drivers/mtd/nand/nand_base.c @@ -3132,8 +3132,8 @@ ident_done: * Bad block marker is stored in the last page of each block * on Samsung and Hynix MLC devices; stored in first two pages * of each block on Micron devices with 2KiB pages and on - * SLC Samsung, Hynix, Toshiba and AMD/Spansion. All others scan - * only the first page. + * SLC Samsung, Hynix, Toshiba, AMD/Spansion, and Macronix. + * All others scan only the first page. */ if ((chip->cellinfo & NAND_CI_CELLTYPE_MSK) && (*maf_id == NAND_MFR_SAMSUNG || @@ -3143,7 +3143,8 @@ ident_done: (*maf_id == NAND_MFR_SAMSUNG || *maf_id == NAND_MFR_HYNIX || *maf_id == NAND_MFR_TOSHIBA || - *maf_id == NAND_MFR_AMD)) || + *maf_id == NAND_MFR_AMD || + *maf_id == NAND_MFR_MACRONIX)) || (mtd->writesize == 2048 && *maf_id == NAND_MFR_MICRON)) chip->bbt_options |= NAND_BBT_SCAN2NDPAGE;