From: Vineet Gupta Date: Mon, 22 Sep 2014 12:24:45 +0000 (+0530) Subject: ARC: cosmetic: Remove unused ECR bitfield masks X-Git-Url: https://git.karo-electronics.de/?a=commitdiff_plain;h=dc9e234f91c77a98a8911bf02619275f51b14bfc;p=linux-beck.git ARC: cosmetic: Remove unused ECR bitfield masks Signed-off-by: Vineet Gupta --- diff --git a/arch/arc/include/asm/arcregs.h b/arch/arc/include/asm/arcregs.h index 221380a73b0a..fe2c3cf82281 100644 --- a/arch/arc/include/asm/arcregs.h +++ b/arch/arc/include/asm/arcregs.h @@ -50,11 +50,7 @@ * [15: 8] = Exception Cause Code * [ 7: 0] = Exception Parameters (for certain types only) */ -#define ECR_VEC_MASK 0xff0000 -#define ECR_CODE_MASK 0x00ff00 -#define ECR_PARAM_MASK 0x0000ff - -/* Exception Cause Vector Values */ +#define ECR_V_MEM_ERR 0x01 #define ECR_V_INSN_ERR 0x02 #define ECR_V_MACH_CHK 0x20 #define ECR_V_ITLB_MISS 0x21 @@ -62,7 +58,8 @@ #define ECR_V_PROTV 0x23 #define ECR_V_TRAP 0x25 -/* Protection Violation Exception Cause Code Values */ +/* DTLB Miss and Protection Violation Cause Codes */ + #define ECR_C_PROTV_INST_FETCH 0x00 #define ECR_C_PROTV_LOAD 0x01 #define ECR_C_PROTV_STORE 0x02