#define TABLE64_TEST_HI 6
/* default VF register test */
-static struct ixgbevf_reg_test reg_test_vf[] = {
+static const struct ixgbevf_reg_test reg_test_vf[] = {
{ IXGBE_VFRDBAL(0), 2, PATTERN_TEST, 0xFFFFFF80, 0xFFFFFF80 },
{ IXGBE_VFRDBAH(0), 2, PATTERN_TEST, 0xFFFFFFFF, 0xFFFFFFFF },
{ IXGBE_VFRDLEN(0), 2, PATTERN_TEST, 0x000FFF80, 0x000FFFFF },
{ 0, 0, 0, 0 }
};
+static const u32 register_test_patterns[] = {
+ 0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF
+};
+
#define REG_PATTERN_TEST(R, M, W) \
{ \
u32 pat, val, before; \
- const u32 _test[] = {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; \
- for (pat = 0; pat < ARRAY_SIZE(_test); pat++) { \
+ for (pat = 0; pat < ARRAY_SIZE(register_test_patterns); pat++) { \
before = readl(adapter->hw.hw_addr + R); \
- writel((_test[pat] & W), (adapter->hw.hw_addr + R)); \
+ writel((register_test_patterns[pat] & W), \
+ (adapter->hw.hw_addr + R)); \
val = readl(adapter->hw.hw_addr + R); \
- if (val != (_test[pat] & W & M)) { \
+ if (val != (register_test_patterns[pat] & W & M)) { \
hw_dbg(&adapter->hw, \
"pattern test reg %04X failed: got " \
"0x%08X expected 0x%08X\n", \
- R, val, (_test[pat] & W & M)); \
+ R, val, (register_test_patterns[pat] & W & M)); \
*data = R; \
writel(before, adapter->hw.hw_addr + R); \
return 1; \
static int ixgbevf_reg_test(struct ixgbevf_adapter *adapter, u64 *data)
{
- struct ixgbevf_reg_test *test;
+ const struct ixgbevf_reg_test *test;
u32 i;
test = reg_test_vf;